Joseph Federico NJ

In Memoriam: Jim Raby

Tribute to Mr. Jim Raby recounting his career from NASA and the US Navy to his founding of Soldering Technology International Inc. 

Solderability and Tinning, Does the Industry Really Know the Difference

Tinning is the process of dipping electronic component terminations into a bath of molten solder alloy, creating a fresh inter metallic layer between the solder and the base metal and providing a highly solderable surface finish. Solderability testing is designed to determine how well molten solder will flow, or “wet”, on the solderable surfaces. This article explains the differences between the two and when each of the tests should be used.

Solderability and Tinning: Does the Industry Know the Difference?

The purpose and use of solderability vs. tinning services often causes confusion, even within the electronic component testing industry. This article explains the difference and when each process is appropriate.

Detecting counterfeit-marked components.

The sophistication of some counterfeit components requires the use multiple test methods to differentiate the counterfeit from the authentic. Different components require different testings and procedures. Use of the wrong testing procedures for the type of component can result in false positives, incorrectly identifying authentic parts as counterfeit.

Issues in Solvent Testing for Counterfeits

Improper counterfeit component testing procedures can yield incorrect or misleading results. This article describes the correct solvent testing procedures for different types of electronic components.

Electrical testing to detect counterfeit components

Counterfeit electronic components are an increasing threat to the supply chain, but there is no single test that can detect all counterfeit parts. This article outlines why it is necessary to create a customized test plan—including a full suite of electrical testing—for each component based on its intended use.

Testing to Detect Counterfeit Components

The quality and sophistication of counterfeit electronic components has increased to the point that these fake parts can pass initial inspection protocols. This article explains how NJMET's counterfeit component test program uses a multilevel inspection process to weed out counterfeit components.

Television Appearance on Counterfeit Detection Fox Business & CNBC

Joseph Federico and Giacomo Federico appear on 21st Century Business aired on Fox Business and CNBC to discuss current developments in Electronic Component Counterfeit Detection

Stopping Counterfeit Parts Before They Do Damage,

Thanks to a groundbreaking program created at NJ Micro Electronic Testing, Inc. (NJMET), the imitation electronic devices that began infiltrating the industry close to a decade ago can now be detected and stopped. It's important that this happens before they are used in the manufacture of products that could put many projects and hundreds of thousands of lives in danger. The multi-faceted process used to identify counterfeits is described.

Television Appearance on Counterfeit Detection

Joseph Federico was invited to discuss NJMET's Counterfiet Detection Program on the Heartbeat of America show in 2007. Joseph Federico and his father Giacomo were also presented with the “Keeping America Strong” award hosted on TV's Heartbeat of America show hosted by William Shatner.

Accelerated Life Tests Yield Failure Data Fast

In recent years, much useful methodology has been developed to predict the life of electronic microcircuits using environmental accelerated steady state life testing. Such testing has been of particular importance in the to the plastic microcircuit arena, which has become increasingly important because of the reform mandated by Secretary of Defense William Perry in 1994 under the Blue Print for Change objective. Such acceleration testing experiments can be vital in predicting the operational future and functional performance of either hermetically sealed or plastic encapsulated microcircuits.

Accelerated Testing on Electronic Microcircuits

Life testing of electronic microcircuits at higher stress levels than design conditions can yield results more quickly saving time and money. Data obtained from accelerated life testing, when properly modelled and analysed yields valuable information on product life and performance under normal use.

Environmental Testing of Plastic Encapsulated Microcircuits

Cutbacks instituted by the Department of Defense diminished military and aerospace manufacturing of hermetically sealed microcircuits (HSMs). As a result, these industries have reconsidered the use of commercial plastic encapsulated microcircuits (PEMs). This article discusses the reliability tests that are essential for determining if PEMs can be safely used in harsh environments.